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Method and apparatus for evaluating multilayer objects for imperfectionsA multilayer object where the layers are arranged in a stacking direction is evaluated for imperfections such as voids, delaminations, and microcracks. First, an acoustic wave is transmitted into the object in the stacking direction via an appropriate transducer/waveguide combination. The wave propagates through the multilayer object and is received by another transducer/waveguide combination preferably located on the same surface as the transmitting combination. The received acoustic wave is correlated with the presence or absence of imperfections by generating pulse echo signals indicative of the received acoustic wave, wherein the successive signals form distinct groups over time. The respective peak amplitudes of each group are sampled and fitted to an exponential curve, wherein a substantial fit of approximately 80-90 percent indicates the absence of imperfections. Alternatively, the time interval between distinct groups can be measured, wherein equal intervals indicate the absence of imperfections and unequal intervals indicate the presence of imperfections.
Document ID
19930003016
Acquisition Source
Langley Research Center
Document Type
Other - Patent Application
Authors
Heyman, Joseph S.
(NASA Langley Research Center Hampton, VA, United States)
Abedin, M. N.
(AS and M, Inc. Hampton, VA, United States)
Date Acquired
August 16, 2013
Publication Date
April 15, 1992
Subject Category
Quality Assurance And Reliability
Report/Patent Number
NAS 1.71:LAR-14581-1-SB
Report Number: NAS 1.71:LAR-14581-1-SB
Patent Number: NASA-CASE-LAR-14581-1-SB
Patent Application Number: US-PATENT-APPL-SN-873407
Accession Number
93N12204
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-LAR-14581-1-SB
Patent Application
US-PATENT-APPL-SN-873407
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