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Advanced one-dimensional optical strain measurement system, phase 4An improved version of the speckle-shift strain measurement system was developed. The system uses a two-dimensional sensor array to maintain speckle correlation in the presence of large off-axis rigid body motions. A digital signal processor (DSP) is used to calculate strains at a rate near the RS-170 camera frame rate. Strain measurements were demonstrated on small diameter wires and fibers used in composite materials research. Accurate values of Young's modulus were measured on tungsten wires, and silicon carbide and sapphire fibers. This optical technique has measured surface strains at specimen temperatures above 750 C and has shown the potential for measurements at much higher temperatures.
Document ID
19930003091
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Lant, Christian T.
(Sverdrup Technology, Inc. Brook Park, OH, United States)
Date Acquired
September 6, 2013
Publication Date
October 1, 1992
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-CR-191184
NAS 1.26:191184
E-7390
Report Number: NASA-CR-191184
Report Number: NAS 1.26:191184
Report Number: E-7390
Accession Number
93N12279
Funding Number(s)
PROJECT: RTOP 590-21-11
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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