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Instrumentation of the variable-angle magneto-optic ellipsometer and its application to M-O media and other non-magnetic filmsA new and comprehensive dielectric tensor characterization instrument is presented for characterization of magneto-optical recording media and non-magnetic thin films. Random and systematic errors of the system are studied. A series of TbFe, TbFeCo, and Co/Pt samples with different composition and thicknesses are characterized for their optical and magneto-optical properties. The optical properties of several non-magnetic films are also measured.
Document ID
19930006319
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Zhou, Andy F. (Arizona Univ. Tucson, AZ, United States)
Erwin, J. Kevin (Arizona Univ. Tucson, AZ, United States)
Mansuripur, M. (Arizona Univ. Tucson, AZ, United States)
Date Acquired
September 6, 2013
Publication Date
March 15, 1992
Publication Information
Publication: Research Studies on Advanced Optical Module(Head Designs for Optical Data Storage
Subject Category
Optics
Accession Number
93N15508
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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