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Combining ray-trace and diffraction analysis: A design exampleAn example is presented of using a combined ray trace and diffraction modeling code to simulate effects of objective-lens tilt in an optical data storage device. In some cases, neither ray-trace analysis nor diffraction analysis can give an adequate description of an optical system. The designer that is faced with the problem of analyzing such a system is forced to use a ray-trace program to determine aberrations in the exit pupil and then introduce aberration coefficients into a diffraction model that simulate the propagation. This approach was found rather awkward, especially if complicated aberrations are present. Our approach is to integrate a diffraction analysis and a ray-trace description of an optical path into one program. Our design is taken from a data storage application, where we must analyze the effects of objective-lens tilt.
Document ID
19930006322
Acquisition Source
Legacy CDMS
Document Type
Other
Authors
Milster, Tom D.
(Arizona Univ. Tucson, AZ, United States)
Treptau, Jeffrey P.
(Cray Research, Inc. Chippewa Falls, WI., United States)
Date Acquired
September 6, 2013
Publication Date
March 15, 1992
Publication Information
Publication: Research Studies on Advanced Optical Module(Head Designs for Optical Data Storage
Subject Category
Optics
Accession Number
93N15511
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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