A new approach for performing contamination control bakeouts in JPL thermal vacuum test chambers

Contamination control requirements for the Wide Field/Planetary Camera II (WF/PC II) are necessarily stringent to protect against post-launch contamination of the sensitive optical surfaces, particularly the cold charge coupled device (CCD) imaging surfaces. Typically, thermal vacuum test chambers have employed a liquid nitrogen (LN2) cold trap to collect outgassed contaminants. This approach has the disadvantage of risking recontamination of the test article from shroud offgassing during post-test warmup of the chamber or from any shroud warming of even a few degrees during the bakeout process. By using an enclave, essentially a chamber within a chamber, configured concentrically and internally within an LN2 shroud, a method was developed, based on a design concept by Taylor, for preventing recontamination of test articles during bakeouts and subsequent post-test warmup of the vacuum chamber. Enclaves for testing WF/PC II components were designed and fabricated, then installed in three of JPL's Environmental Test Lab chambers. The design concepts, operating procedures, and test results of this development are discussed.