Reliability study of the NiH2 strain gage

This paper summarizes a joint study by Gates Aerospace Batteries (GAB) and the Reliability Analysis Center (RAC). This study characterizes the reliability and robustness of the temperature compensated strain gages currently specified for sensing of internal pressure of NiH2 cells. These strain gages are characterized as fully encapsulated, metallic foil grids with known resistance that varies with deformation. The measurable deformation, when typically installed on the hemispherical portion of a NiH2 cell, is proportional to the material stresses as generated by internal cell pressures. The internal pressure sensed in this manner is calibrated to indicate the state-of-charge for the cell. This study analyzes and assesses both robustness and reliability for the basic design of the strain gage, the installation of the strain gage, and the circuitry involved.