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Measurement of the Relative and Absolute Microgravity Environment of Space Platforms, Recent Flight Results, and Determination of the Spatial Microgravity FieldMicrogravity material processing in space, such as crystal growth, requires specific and accurate knowledge of the very low frequency, very low level microgravity. This means knowledge of absolute microgravity levels. Most acceleration measurement systems for space platforms only measure 'microvibrations,' the measurement of the absolute microgravity level being severely corrupted by bias errors, temperature hysteresis, nonlinearity by-products, and bias changes due to launch vibrations. An advanced system was developed incorporating a fixed 3-axis acceleration measurement system with improved signal conditioning and Invertible Accelerometers for absolute measurements. The higher sensitivity channels have lower frequency low pass filtering to meet crystal growers demands for recording of low level/low frequency disturbances. Also included is a pre-flight bias adjustment feature.
Document ID
19930019536
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Bijvoet, J. A.
(Alabama Univ. Huntsville, AL, United States)
Randorf, J.
(Alabama Univ. Huntsville, AL, United States)
Wingo, D. R.
(Alabama Univ. Huntsville, AL, United States)
Blakely, J. R.
(Alabama Univ. Huntsville, AL, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1992
Publication Information
Publication: NASA, Washington, NASA(DOD Flight Experiments Technical Interchange Meeting Proceedings
Subject Category
Materials Processing
Accession Number
93N28725
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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