NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
X Ray, Far, and Extreme Ultraviolet Coatings for Space ApplicationsThe idea of utilizing imaging mirrors as narrow band filters constitutes the basis of the design of extreme ultraviolet imagers operating at 58.4 nm and 83.4 nm. The net throughput of both imaging-filtering systems is better than 20 percent. The superiority of the EUV self-filtering camera/telescope becomes apparent when compared to previously theoretically designed 83.4-nm filtering-imaging systems, which yielded transmissions of less than a few percent and therefore less than 0.1 percent throughput when combined with at least two imaging mirrors. Utilizing the self-filtering approach, instruments with similar performances are possible for imaging at other EUV wavelengths, such as 30.4 nm. The self-filtering concept is extended to the X-ray region where its application can result in the new generation of X-ray telescopes, which could replace current designs based on large and heavy collimators.
Document ID
19930019640
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Zukic, M.
(Alabama Univ. Huntsville, AL, United States)
Torr, D. G.
(Alabama Univ. Huntsville, AL, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1993
Publication Information
Publication: Lunar and Planetary Inst., Workshop on Advanced Technologies for Planetary Instruments, Part 1
Subject Category
Nonmetallic Materials
Accession Number
93N28829
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available