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Scanning electron microscope/energy dispersive x ray analysis of impact residues in LDEF tray clampsDetailed optical scanning of tray clamps is being conducted in the Facility for the Optical Inspection of Large Surfaces at JSC to locate and document impacts as small as 40 microns in diameter. Residues from selected impacts are then being characterized by Scanning Electron Microscopy/Energy Dispersive X-ray Analysis at CNES. Results from this analysis will be the initial step to classifying projectile residues into specific sources.
Document ID
19930020180
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Bernhard, Ronald P. (Lockheed Engineering and Sciences Co. Houston, TX., United States)
Durin, Christian (Centre National d'Etudes Spatiales Toulouse, France)
Zolensky, Michael E. (NASA Lyndon B. Johnson Space Center Houston, TX, United States)
Date Acquired
September 6, 2013
Publication Date
April 1, 1993
Publication Information
Publication: NASA. Langley Research Center, LDEF: 69 Months in Space. Second Post-Retrieval Symposium, Part 2
Subject Category
Spacecraft Design, Testing And Performance
Accession Number
93N29369
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19930020165Collected WorksLDEF: 69 Months in Space. Second Post-Retrieval Symposium, part 2
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