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Laser Metrology System For A Segmented Telescope ReflectorReport describes proposed laser metrology system in far-infrared telescope with segmented primary reflector. Telescope to be flown in outer space and used to observe celestial objects. Laser metrology system mounted on structure that supported secondary telescope reflector and measures relative positions and alignments of segments of primary reflector. System used in pointing as well as in maintaining surface figure.
Document ID
19940000314
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Lau, Kenneth H.
(Caltech)
Date Acquired
August 16, 2013
Publication Date
May 1, 1994
Publication Information
Publication: Laser Tech. Brief.
Volume: 2
Issue: 2
Subject Category
Physical Sciences
Report/Patent Number
NPO-18850
Report Number: NPO-18850
Accession Number
94B10314
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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