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Sensor Detects Semiconductor Escaping From AmpouleSensor detects breakage of ampoule containing molten semiconductor. Chemical reaction between hot semiconductor material and wire causes step increase in electrical resistance and temperature of wire. Because of step increase in resistance, sensor regarded as operating in simple on/off mode used to shut down crystal-growth furnaces automatically. Sensor incorporated into cartridge in various ways; affixed to outer wall of ampoule or to inner wall of cartridge by mechanical mounting or by vapor deposition.
Document ID
19940000627
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Watring, Dale A.
(NASA Marshall Space Flight Center, Huntsville, AL.)
Johnson, Martin L.
(NASA Marshall Space Flight Center, Huntsville, AL.)
Date Acquired
August 16, 2013
Publication Date
November 1, 1994
Publication Information
Publication: NASA Tech Briefs
Volume: 18
Issue: 11
ISSN: 0145-319X
Subject Category
Physical Sciences
Report/Patent Number
MFS-28852
Report Number: MFS-28852
ISSN: 0145-319X
Accession Number
94B10627
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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