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Radiation-Protected Protocols For Self-Testing Of MicrocircuitsIonizing radiation need not trigger unintended self-testing. Protocols installed in certain microcircuits permitting functional self-testing do not consider possibility of inadvertent triggering by protons or energetic heavy ions in space or satellite orbit. Recommended devices be rendered immune to so-called single event effects of energetic ions in cosmic rays, flares, or trapped-charge belts surrounding Earth and some other planets. Proposed pair of stimuli be applied to device in specified manner to start self-test. Protocol can require two or more stimuli at single node, or pair of stimuli at two nodes, or some more complicated combination.
Document ID
19940000666
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Nichols, Donald K.
(Caltech)
Date Acquired
August 16, 2013
Publication Date
December 1, 1994
Publication Information
Publication: NASA Tech Briefs
Volume: 18
Issue: 12
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-19047
ISSN: 0145-319X
Report Number: NPO-19047
Accession Number
94B10666
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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