A fail-safe CMOS logic gateThis paper reports a design technique to make Complex CMOS Gates fail-safe for a class of faults. Two classes of faults are defined. The fail-safe design presented has limited fault-tolerance capability. Multiple faults are also covered.
Document ID
19940004350
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Bobin, V. (Idaho Univ. Moscow, ID, United States)
Whitaker, S. (Idaho Univ. Moscow, ID, United States)
Date Acquired
August 16, 2013
Publication Date
November 6, 1990
Publication Information
Publication: The 2nd 1990 NASA SERC Symposium on VLSI Design
IDRelationTitle19940004343Collected WorksNASA Space Engineering Research Center Symposium on VLSI Design19940004343Collected WorksNASA Space Engineering Research Center Symposium on VLSI Design