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Heat flux measurements on ceramics with thin film thermocouplesTwo methods were devised to measure heat flux through a thick ceramic using thin film thermocouples. The thermocouples were deposited on the front and back face of a flat ceramic substrate. The heat flux was applied to the front surface of the ceramic using an arc lamp Heat Flux Calibration Facility. Silicon nitride and mullite ceramics were used; two thicknesses of each material was tested, with ceramic temperatures to 1500 C. Heat flux ranged from 0.05-2.5 MW/m2(sup 2). One method for heat flux determination used an approximation technique to calculate instantaneous values of heat flux vs time; the other method used an extrapolation technique to determine the steady state heat flux from a record of transient data. Neither method measures heat flux in real time but the techniques may easily be adapted for quasi-real time measurement. In cases where a significant portion of the transient heat flux data is available, the calculated transient heat flux is seen to approach the extrapolated steady state heat flux value as expected.
Document ID
19940006838
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Holanda, Raymond
(NASA Lewis Research Center Cleveland, OH, United States)
Anderson, Robert C.
(NASA Lewis Research Center Cleveland, OH, United States)
Liebert, Curt H.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 6, 2013
Publication Date
November 1, 1993
Subject Category
Instrumentation And Photography
Report/Patent Number
NAS 1.15:106305
E-7963
NASA-TM-106305
Meeting Information
Meeting: SEM Fall Conference Structural Testing Technology at High Temperature
Location: Ojai, CA
Country: United States
Start Date: November 8, 1993
End Date: November 10, 1993
Sponsors: Society for Experimental Mechanics
Accession Number
94N11310
Funding Number(s)
PROJECT: RTOP 505-62-50
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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