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High temperature strain measurement with a resistance strain gageA PdCr based electrical resistance strain gage was demonstrated in the laboratory to be a viable sensor candidate for static strain measurement at high temperatures. However, difficulties were encountered while transferring the sensor to field applications. This paper is therefore prepared for recognition and resolution of the problems likely to be encountered with PdCr strain gages in field applications. Errors caused by the measurement system, installation technique and lead wire attachment are discussed. The limitations and some considerations related to the temperature compensation technique used for this gage are also addressed.
Document ID
19940014841
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Lei, Jih-Fen
(Sverdrup Technology, Inc. Brook Park, OH, United States)
Fichtel, ED
(Pratt and Whitney Aircraft Group West Palm Beach, FL., United States)
Mcdaniel, Amos
(Pratt and Whitney Aircraft Group West Palm Beach, FL., United States)
Date Acquired
September 6, 2013
Publication Date
December 1, 1993
Subject Category
Instrumentation And Photography
Report/Patent Number
E-8300
NAS 1.26:194441
NASA-CR-194441
Report Number: E-8300
Report Number: NAS 1.26:194441
Report Number: NASA-CR-194441
Meeting Information
Meeting: SEM Fall Conference and Exhibit: Structural Testing Technology at High Temperature-2
Location: Ojai, CA
Country: United States
Start Date: November 8, 1993
End Date: November 10, 1993
Accession Number
94N19314
Funding Number(s)
PROJECT: RTOP 505-62-5B
CONTRACT_GRANT: NAS3-25266
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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