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Attenuation of epsilon(sub eff) of coplanar waveguide transmission lines on silicon substratesAttenuation and epsilon(sub eff) of Coplanar Waveguide (CPW) transmission lines were measured on Silicon substrates with resistivities ranging from 400 to greater than 30,000 ohm-cm, that have a 1000 angstrom coating of SiO2. Both attenuation and epsilon(sub eff) are given over the frequency range 5 to 40 GHz for various strip and slot widths. These measured values are also compared to the theoretical values.
Document ID
19940016031
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Taub, Susan R.
(NASA Lewis Research Center Cleveland, OH, United States)
Young, Paul G.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 6, 2013
Publication Date
August 1, 1993
Publication Information
Publication: Solid State Technology Branch of NASA Lewis Research Center: Fifth Annual Digest
Subject Category
Electronics And Electrical Engineering
Accession Number
94N20504
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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