NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Radiographic MoireA method for the x-ray inspection of materials making use of the Moire effect is described. The Moire effect results when two patterns are superimposed; a third pattern is produced. Any change in either of the first two patterns creates a change in the third. Moire inspection is common with visible light. This invention allows the technique to be extended to locations inaccessible to visual inspection. A first pattern of high radio contrast material is attached to or included in the sample. X-rays are projected through the sample. A second pattern is imposed at the observation point, either before or after the formation of the x-ray image. The two patterns interact to create a third, Moire, pattern. As the material is stressed the Moire pattern changes, the degree of change indicating the degree of stress.
Document ID
19950007422
Acquisition Source
Headquarters
Document Type
Other - Patent Application
Authors
Madaras, Eric Irvine
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 17, 2013
Publication Date
May 31, 1994
Subject Category
Quality Assurance And Reliability
Report/Patent Number
NAS 1.71:LAR-15104-1
Report Number: NAS 1.71:LAR-15104-1
Patent Application Number: US-PATENT-APPL-SN-251434
Patent Number: NASA-CASE-LAR-15104-1
Accession Number
95N13835
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-LAR-15104-1
Patent Application
US-PATENT-APPL-SN-251434
No Preview Available