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X-ray Photoelectron Spectroscopy (XPS), Rutherford Back Scattering (RBS) studiesX-ray photoelectron spectroscopy (XPS), Rutherford Back Scattering (RBS) studies of each of sample received were completed. Since low angle X-ray could not be performed because of instrumentation problems, Auger spectrometry was employed instead. The results of these measurements for each of the samples is discussed in turn.
Document ID
19950008453
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Neely, W. C. (Auburn Univ. AL, United States)
Bozak, M. J. (Auburn Univ. AL, United States)
Williams, J. R. (Auburn Univ. AL, United States)
Date Acquired
September 6, 2013
Publication Date
December 16, 1993
Subject Category
Inorganic And Physical Chemistry
Report/Patent Number
NAS 1.26:196536
NASA-CR-196536
Report Number: NAS 1.26:196536
Report Number: NASA-CR-196536
Accession Number
95N14867
Funding Number(s)
CONTRACT_GRANT: NAS8-39131
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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