Investigation of Allan variance for determining noise spectral forms with application to microwave radiometry

An investigation of the Allan variance method as a possible means for characterizing fluctuations in radiometric noise diodes has been performed. The goal is to separate fluctuation components into white noise, flicker noise, and random-walk noise. The primary means is by discrete-time processing, and the study focused primarily on the digital processes involved. Noise satisfying the requirements was generated by direct convolution, fast Fourier transformation (FFT) processing in the time domain, and FFT processing in the frequency domain. Some of the numerous results obtained are presented along with the programs used in the study.