NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login

Press Enter or click the Search button to begin your search.

Back to Results
Micro-sensor thin-film anemometerA device for measuring turbulence in high-speed flows is provided which includes a micro-sensor thin-film probe. The probe is formed from a single crystal of aluminum oxide having a 14 deg half-wedge shaped portion. The tip of the half-wedge is rounded and has a thin-film sensor attached along the stagnation line. The bottom surface of the half-wedge is tilted upward to relieve shock induced disturbances created by the curved tip of the half-wedge. The sensor is applied using a microphotolithography technique.
Document ID
19950016489
Acquisition Source
Legacy CDMS
Document Type
Other - Patent Application
Authors
Sheplak, Mark (Syracuse Univ. NY., United States)
Mcginley, Catherine B. (NASA Langley Research Center Hampton, VA, United States)
Spina, Eric F. (Syracuse Univ. NY., United States)
Stephens, Ralph M. (NASA Langley Research Center Hampton, VA, United States)
Hopson, Purnell, Jr. (NASA Langley Research Center Hampton, VA, United States)
Cruz, Vincent B. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 16, 2013
Publication Date
November 24, 1994
Subject Category
Fluid Mechanics And Heat Transfer
Report/Patent Number
NAS 1.71:LAR-15112-1-CU
Report Number: NAS 1.71:LAR-15112-1-CU
Patent Number: NASA-CASE-LAR-15112-1-CU
Patent Application Number: US-PATENT-APPL-SN-361601
Accession Number
95N22906
Funding Number(s)
CONTRACT_GRANT: NAG1-1400
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-LAR-15112-1-CU
Patent Application
US-PATENT-APPL-SN-361601

Related Records

There are no records associated with this record.
No Preview Available