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X-ray transmission microscope developmentWe are developing a hard x-ray microscope for direct observation of solidification dynamics in metal alloys and metal matrix composites. The Fein-Focus Inc. x-ray source was delivered in September and found to perform better than expected. Confirmed resolution of better than 2 micrometers was obtained and magnifications up to 800X were measured. Nickel beads of 30 micrometer diameter were easily detected through 6mm of aluminum. X-ray metallography was performed on several specimens showing high resolution and clear definition of 3-dimensional structures. Prototype furnace installed and tested.
Document ID
19950016599
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Kaukler, William F. (Alabama Univ. Huntsville, AL, United States)
Rosenberger, Franz E. (Alabama Univ. Huntsville, AL, United States)
Date Acquired
September 6, 2013
Publication Date
March 1, 1995
Subject Category
Optics
Report/Patent Number
NAS 1.26:197884
NASA-CR-197884
Report Number: NAS 1.26:197884
Report Number: NASA-CR-197884
Accession Number
95N23016
Funding Number(s)
CONTRACT_GRANT: NAS8-40185
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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