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Hardware cleanliness methodology and certificationInadequacy of mass loss cleanliness criteria for selection of materials for contamination sensitive uses, and processing of flight hardware for contamination sensitive instruments is discussed. Materials selection for flight hardware is usually based on mass loss (ASTM E-595). However, flight hardware cleanliness (MIL 1246A) is a surface cleanliness assessment. It is possible for materials (e.g. Sil-Pad 2000) to pass ASTM E-595 and fail MIL 1246A class A by orders of magnitude. Conversely, it is possible for small amounts of nonconforming material (Huma-Seal conformal coating) to not present significant cleanliness problems to an optical flight instrument. Effective cleaning (precleaning, precision cleaning, and ultra cleaning) and cleanliness verification are essential for contamination sensitive flight instruments. Polish cleaning of hardware, e.g. vacuum baking for vacuum applications, and storage of clean hardware, e.g. laser optics, is discussed. Silicone materials present special concerns for use in space because of the rapid conversion of the outgassed residues to glass by solar ultraviolet radiation and/or atomic oxygen. Non ozone depleting solvent cleaning and institutional support for cleaning and certification are also discussed.
Document ID
19950021235
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Harvey, Gale A.
(NASA Langley Research Center Hampton, VA, United States)
Lash, Thomas J.
(NASA Langley Research Center Hampton, VA, United States)
Rawls, J. Richard
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 6, 2013
Publication Date
February 1, 1995
Publication Information
Publication: LDEF: 69 Months in Space. Third Post-Retrieval Symposium, Part 3
Subject Category
Inorganic And Physical Chemistry
Accession Number
95N27656
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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