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Extended linear ion trap frequency standard apparatusA linear ion trap for frequency standard applications is provided with a plurality of trapping rods equally spaced and applied quadruple rf voltages for radial confinement of atomic ions and biased level pins at each end for axial confinement of the ions. The trapping rods are divided into two linear ion trap regions by a gap in each rod in a common radial plane to provide dc discontinuity, thus dc isolating one region from the other. A first region for ion-loading and preparation fluorescence is biased with a dc voltage to transport ions into a second region for resonance frequency comparison with a local oscillator derived frequency while the second region is held at zero voltage. The dc bias voltage of the regions is reversed for transporting the ions back into the first region for fluorescence measurement. The dual mode cycle is repeated continuously for comparison and feedback control of the local oscillator derived frequency. Only the second region requires magnetic shielding for the resonance function which is sensitive to any ambient magnetic fields.
Document ID
19950021927
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Prestage, John D.
(Jet Propulsion Lab. California Inst. of Tech., Pasadena, CA., United States)
Date Acquired
August 16, 2013
Publication Date
May 30, 1995
Subject Category
Atomic And Molecular Physics
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-246041
Patent Number: US-PATENT-5,420,549
Patent Number: NASA-CASE-NPO-19081-1-CU
Accession Number
95N28348
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-PATENT-5,420,549|NASA-CASE-NPO-19081-1-CU
Patent Application
US-PATENT-APPL-SN-246041
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