NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Dielectric property measurements in the Electromagnetic Properties Measurement LaboratoryThe capability to measure the dielectric properties of various materials has been developed in the Electromagnetic Properties Measurement Laboratory (EPML) of the Electromagnetics Research Branch (ERB). Two measurement techniques which have been implemented in the EPML to characterize materials are the dielectric probe and waveguide techniques. Several materials, including some for which the dielectric properties are well known, have been measured in an attempt to establish the capabilities of the EPML in determining dielectric properties. Brief descriptions of the two techniques are presented in this report, along with representative results obtained during these measurements.
Document ID
19950023915
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Cravey, Robin L.
(NASA Langley Research Center Hampton, VA, United States)
Tiemsin, Pacita I.
(NASA Langley Research Center Hampton, VA, United States)
Bussell, Kerri
(Old Dominion Univ. Norfolk, VA., United States)
Dudley, Kenneth L.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 6, 2013
Publication Date
April 1, 1995
Subject Category
Communications And Radar
Report/Patent Number
NAS 1.15:110147
NASA-TM-110147
Report Number: NAS 1.15:110147
Report Number: NASA-TM-110147
Accession Number
95N30336
Funding Number(s)
PROJECT: RTOP 505-64-52-04
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available