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A microwave plasma cleaning apparatusIn a microwave electron cyclotron resonance plasma source, reactive plasmas of oxygen and its mixtures of argon have been used for evaluating plasma cleaning technologies. Small aluminum samples (0.95 x 1.9 cm) were coated with thin films (less than or equal to 20 micrometers in thickness) of Shell Vitrea oil and cleaned with reactive plasmas. The discharge parameters, such as gas pressure, magnetic field, substrate biasing, and microwave power, were varied to change cleaning conditions. A mass spectroscopy (or residual gas analyzer) was used to monitor the status of plasma cleaning. Mass loss of the samples after plasma cleaning was measured to estimate cleaning rates. Measured cleaning rates of low-pressure (0.5-m torr) argon/oxygen plasmas were as high as 2.7 micrometers/min. X-ray photoelectron spectroscopy was used to determine cleanliness of the sample surfaces. In this paper, significant results of the plasma cleaning are reported and discussed.
Document ID
19950025365
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Tsai, C. C.
(Oak Ridge National Lab. TN, United States)
Nelson, W. D.
(Oak Ridge National Lab. TN, United States)
Schechter, D. E.
(Oak Ridge National Lab. TN, United States)
Thompson, L. M.
(Oak Ridge National Lab. TN, United States)
Glover, A. L.
(Oak Ridge National Lab. TN, United States)
Date Acquired
September 6, 2013
Publication Date
March 1, 1995
Publication Information
Publication: NASA. Marshall Space Flight Center, Aerospace Environmental Technology Conference
Subject Category
Plasma Physics
Accession Number
95N31786
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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