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Contamination detection NDE for cleaning process inspectionIn the joining of multilayer materials, and in welding, the cleanliness of the joining surface may play a large role in the quality of the resulting bond. No non-intrusive techniques are currently available for the rapid measurement of contamination on large or irregularly shaped structures prior to the joining process. An innovative technique for the measurement of contaminant levels in these structures using laser based imaging is presented. The approach uses an ultraviolet excimer laser to illuminate large and/or irregular surface areas. The UV light induces fluorescence and is scattered from the contaminants. The illuminated area is viewed by an image-intensified CCD (charge coupled device) camera interfaced to a PC-based computer. The camera measures the fluorescence and/or scattering from the contaminants for comparison with established standards. Single shot measurements of contamination levels are possible. Hence, the technique may be used for on-line NDE testing during manufacturing processes.
Document ID
19950025381
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Marinelli, W. J.
(Physical Sciences, Inc. Andover, MA, United States)
Dicristina, V.
(Physical Sciences, Inc. Andover, MA, United States)
Sonnenfroh, D.
(Physical Sciences, Inc. Andover, MA, United States)
Blair, D.
(Physical Sciences, Inc. Andover, MA, United States)
Date Acquired
September 6, 2013
Publication Date
March 1, 1995
Publication Information
Publication: NASA. Marshall Space Flight Center, Aerospace Environmental Technology Conference
Subject Category
Quality Assurance And Reliability
Accession Number
95N31802
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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