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Surface inspection using FTIR spectroscopyThe use of reflectance Fourier transform infrared (FTIR) spectroscopy as a tool for surface inspection is described. Laboratory instruments and portable instruments can support remote sensing probes that can map chemical contaminants on surfaces with detection limits under the best of conditions in the sub-nanometer range, i.e.. near absolute cleanliness, excellent performance in the sub-micrometer range, and useful performance for films tens of microns thick. Examples of discovering and quantifying contamination such as mineral oils and greases, vegetable oils, and silicone oils on aluminum foil, galvanized sheet steel, smooth aluminum tubing, and sandblasted 7075 aluminum alloy and D6AC steel. The ability to map in time and space the distribution of oil stains on metals is demonstrated. Techniques associated with quantitatively applying oils to metals, subsequently verifying the application, and non-linear relationships between reflectance and the quantity oil are described.
Document ID
19950025382
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Powell, G. L.
(Martin Marietta Energy Systems, Inc. Oak Ridge, TN, United States)
Smyrl, N. R.
(Martin Marietta Energy Systems, Inc. Oak Ridge, TN, United States)
Williams, D. M.
(Martin Marietta Energy Systems, Inc. Oak Ridge, TN, United States)
Meyers, H. M., III
(Martin Marietta Energy Systems, Inc. Oak Ridge, TN, United States)
Barber, T. E.
(Oak Ridge Inst. for Science and Education TN., United States)
Marrero-Rivera, M.
(Oak Ridge Inst. for Science and Education TN., United States)
Date Acquired
September 6, 2013
Publication Date
March 1, 1995
Publication Information
Publication: NASA. Marshall Space Flight Center, Aerospace Environmental Technology Conference
Subject Category
Optics
Accession Number
95N31803
Funding Number(s)
CONTRACT_GRANT: DE-AC05-84OR-21400
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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