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Probes Measure SlotsContact probes devised for measuring depths and widths of slots. Configured in conical or wedge shapes, depending on specific applications. Conical or wedge surface of probe centers probe in slot, while two thin probe rods made to protrude from cone or wedge until their tips simultaneously make contact with outer surface and bottom of slot.
Document ID
19950065552
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Maslakowski, John E. (Rockwell International Corp.)
Gilbert, Jeffrey L. (Rockwell International Corp.)
Date Acquired
August 17, 2013
Publication Date
August 1, 1995
Publication Information
Publication: NASA Tech Briefs
Volume: 19
Issue: 8
ISSN: 0145-319X
Subject Category
Fabrication Technology
Report/Patent Number
MFS-30052
ISSN: 0145-319X
Report Number: MFS-30052
Accession Number
95B10393
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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