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Automatic force balance calibration systemA system for automatically calibrating force balances is provided. The invention uses a reference balance aligned with the balance being calibrated to provide superior accuracy while minimizing the time required to complete the calibration. The reference balance and the test balance are rigidly attached together with closely aligned moment centers. Loads placed on the system equally effect each balance, and the differences in the readings of the two balances can be used to generate the calibration matrix for the test balance. Since the accuracy of the test calibration is determined by the accuracy of the reference balance and current technology allows for reference balances to be calibrated to within +/-0.05% the entire system has an accuracy of +/-0.2%. The entire apparatus is relatively small and can be mounted on a movable base for easy transport between test locations. The system can also accept a wide variety of reference balances, thus allowing calibration under diverse load and size requirements.
Document ID
19960001927
Acquisition Source
Legacy CDMS
Document Type
Other - Patent Application
Authors
Ferris, Alice T.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
August 17, 2013
Publication Date
May 10, 1995
Subject Category
Instrumentation And Photography
Report/Patent Number
NAS 1.71:LAR-15362-1
Patent Number: NASA-CASE-LAR-15362-1
Report Number: NAS 1.71:LAR-15362-1
Patent Application Number: US-PATENT-APPL-SN-438409
Accession Number
96N11935
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-LAR-15362-1
Patent Application
US-PATENT-APPL-SN-438409
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