NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Parameter estimation techniques based on optimizing goodness-of-fit statistics for structural reliabilityNew methods are presented that utilize the optimization of goodness-of-fit statistics in order to estimate Weibull parameters from failure data. It is assumed that the underlying population is characterized by a three-parameter Weibull distribution. Goodness-of-fit tests are based on the empirical distribution function (EDF). The EDF is a step function, calculated using failure data, and represents an approximation of the cumulative distribution function for the underlying population. Statistics (such as the Kolmogorov-Smirnov statistic and the Anderson-Darling statistic) measure the discrepancy between the EDF and the cumulative distribution function (CDF). These statistics are minimized with respect to the three Weibull parameters. Due to nonlinearities encountered in the minimization process, Powell's numerical optimization procedure is applied to obtain the optimum value of the EDF. Numerical examples show the applicability of these new estimation methods. The results are compared to the estimates obtained with Cooper's nonlinear regression algorithm.
Document ID
19960007318
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Starlinger, Alois
(NASA Lewis Research Center Cleveland, OH, United States)
Duffy, Stephen F.
(Cleveland State Univ. OH., United States)
Palko, Joseph L.
(Cleveland State Univ. OH., United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1993
Subject Category
Quality Assurance And Reliability
Report/Patent Number
NAS 1.15:111143
NASA-TM-111143
NIPS-95-06104
Report Number: NAS 1.15:111143
Report Number: NASA-TM-111143
Report Number: NIPS-95-06104
Accession Number
96N14483
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available