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Hidden Markov models for fault detection in dynamic systemsThe invention is a system failure monitoring method and apparatus which learns the symptom-fault mapping directly from training data. The invention first estimates the state of the system at discrete intervals in time. A feature vector x of dimension k is estimated from sets of successive windows of sensor data. A pattern recognition component then models the instantaneous estimate of the posterior class probability given the features, p(w(sub i) (vertical bar)/x), 1 less than or equal to i isless than or equal to m. Finally, a hidden Markov model is used to take advantage of temporal context and estimate class probabilities conditioned on recent past history. In this hierarchical pattern of information flow, the time series data is transformed and mapped into a categorical representation (the fault classes) and integrated over time to enable robust decision-making.
Document ID
19960012392
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Smyth, Padhraic J.
(NASA Pasadena Office CA, United States)
Date Acquired
August 17, 2013
Publication Date
November 7, 1995
Subject Category
Quality Assurance And Reliability
Report/Patent Number
Patent Application Number: US-PATENT-APPL-SN-047135
Patent Number: NASA-CASE-NPO-18982-1-CU
Patent Number: US-PATENT-5,465,321
Accession Number
96N18629
Funding Number(s)
CONTRACT_GRANT: NAS7-918
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-CASE-NPO-18982-1-CU|US-PATENT-5,465,321
Patent Application
US-PATENT-APPL-SN-047135
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