NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Scanning and Transmission Electron Microscopy of High Temperature MaterialsSoftware and hardware updates to further extend the capability of the electron microscope were carried out. A range of materials such as intermetallics, metal-matrix composites, ceramic-matrix composites, ceramics and intermetallic compounds, based on refractory elements were examined under this research. Crystal structure, size, shape and volume fraction distribution of various phases which constitute the microstructures were examined. Deformed materials were studied to understand the effect of interfacial microstructure on the deformation and fracture behavior of these materials. Specimens tested for a range of mechanical property requirements, such as stress rupture, creep, low cycle fatigue, high cycle fatigue, thermomechanical fatigue, etc. were examined. Microstructural and microchemical stability of these materials exposed to simulated operating environments were investigated. The EOIM Shuttle post-flight samples were also examined to understand the influence of low gravity processing on microstructure. In addition, fractographic analyses of Nb-Zr-W, titanium aluminide, molybdenum silicide and silicon carbide samples were carried out. Extensive characterization of sapphire fibers in the fiber-reinforced composites made by powder cloth processing was made. Finally, pressure infiltration casting of metal-matrix composites was carried out.
Document ID
19960022935
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Date Acquired
September 6, 2013
Publication Date
January 1, 1994
Subject Category
Composite Materials
Report/Patent Number
NAS 1.26:200983
NASA-CR-200983
Report Number: NAS 1.26:200983
Report Number: NASA-CR-200983
Accession Number
96N25809
Funding Number(s)
CONTRACT_GRANT: NCC3-287
CONTRACT_GRANT: NCC3-228
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available