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X-Ray Diffraction ApparatusAn x-ray diffraction apparatus for use in analyzing the x-ray diffraction pattern of a sample is introduced. The apparatus includes a beam source for generating a collimated x-ray beam having one or more discrete x-ray energies, a holder for holding the sample to be analyzed in the path of the beam, and a charge-coupled device having an array of pixels for detecting, in one or more selected photon energy ranges, x-ray diffraction photons produced by irradiating such a sample with said beam. The CCD is coupled to an output unit which receives input information relating to the energies of photons striking each pixel in the CCD, and constructs the diffraction pattern of photons within a selected energy range striking the CCD.
Document ID
19960034341
Acquisition Source
Ames Research Center
Document Type
Other - Patent
Authors
Blake, David F.
(NASA Ames Research Center Moffett Field,CA United States)
Bryson, Charles
(NASA Ames Research Center Moffett Field,CA United States)
Freund, Friedmann
(NASA Ames Research Center Moffett Field,CA United States)
Date Acquired
August 17, 2013
Publication Date
February 13, 1996
Subject Category
Optics
Report/Patent Number
Patent Number: US-Patent-5,491,738
Patent Application Number: US-Patent-Appl-SN-033306
Patent Number: NASA-Case-ARC-12043-1-CU
Accession Number
96N30204
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-5,491,738|NASA-Case-ARC-12043-1-CU
Patent Application
US-Patent-Appl-SN-033306
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