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Applications of the Analytical Electron Microscope to Materials ScienceIn the last 20 years, the analytical electron microscope (AEM) as allowed investigators to obtain chemical and structural information from less than 50 nanometer diameter regions in thin samples of materials and to explore problems where reactions occur at boundaries and interfaces or within small particles or phases in bulk samples. Examples of the application of the AEM to materials science problems are presented in this paper and demonstrate the usefulness and the future potential of this instrument.
Document ID
19960045496
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Goldstein, J. I. (Lehigh Univ. Bethlehem, PA United States)
Date Acquired
September 6, 2013
Publication Date
October 1, 1992
Subject Category
Inorganic And Physical Chemistry
Report/Patent Number
NAS 1.26:202090
NASA-CR-202090
Report Number: NAS 1.26:202090
Report Number: NASA-CR-202090
Meeting Information
Meeting: Micromat 1992
Location: Rio de Janeiro
Country: Brazil
Start Date: October 28, 1992
End Date: October 30, 1992
Accession Number
96N32410
Funding Number(s)
CONTRACT_GRANT: NAG9-45
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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