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Integrated Optical Interferometers with Micromachined Diaphragms for Pressure SensingOptical pressure sensors have been fabricated which use an integrated optical channel waveguide that is part of an interferometer to measure the pressure-induced strain in a micromachined silicon diaphragm. A silicon substrate is etched from the back of the wafer leaving a rectangular diaphragm. On the opposite side of the wafer, ring resonator and Mach-Zehnder interferometers are formed with optical channel waveguides made from a low pressure chemical vapor deposited film of silicon oxynitride. The interferometer's phase is altered by pressure-induced stress in a channel segment positioned over the long edge of the diaphragm. The phase change in the ring resonator is monitored using a link-insensitive swept frequency laser diode, while in the Mach-Zehnder it is determined using a broad band super luminescent diode with subsequent wavelength separation. The ring resonator was found to be highly temperature sensitive, while the Mach-Zehnder, which had a smaller optical path length difference, was proportionally less so. The quasi-TM mode was more sensitive to pressure, in accord with calculations. Waveguide and sensor theory, sensitivity calculations, a fabrication sequence, and experimental results are presented.
Document ID
19970003003
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
DeBrabander, Gregory N.
(Cincinnati Univ. OH United States)
Boyd, Joseph T.
(NASA Lewis Research Center Cleveland, OH United States)
Date Acquired
September 6, 2013
Publication Date
September 1, 1996
Subject Category
Optics
Report/Patent Number
NASA CR-202535
NAS 1.26:202535
Report Number: NASA CR-202535
Report Number: NAS 1.26:202535
Accession Number
97N11778
Funding Number(s)
CONTRACT_GRANT: NAG3-852
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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