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Method of Testing and Predicting Failures of Electronic Mechanical SystemsA method employing a knowledge base of human expertise comprising a reliability model analysis implemented for diagnostic routines is disclosed. The reliability analysis comprises digraph models that determine target events created by hardware failures human actions, and other factors affecting the system operation. The reliability analysis contains a wealth of human expertise information that is used to build automatic diagnostic routines and which provides a knowledge base that can be used to solve other artificial intelligence problems.
Document ID
19970004270
Acquisition Source
Headquarters
Document Type
Other - Patent
Authors
Iverson, David L.
(NASA Headquarters Washington, DC United States)
Patterson-Hine, Frances A.
(NASA Headquarters Washington, DC United States)
Date Acquired
August 17, 2013
Publication Date
December 3, 1996
Subject Category
Quality Assurance And Reliability
Report/Patent Number
Patent Application Number: US-Patents-Appl-SN-332198
Patent Number: US-Patent-5,581,694
Accession Number
97N12520
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-5,581,694
Patent Application
US-Patents-Appl-SN-332198
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