NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Collections About News Help Login
Back to Results
Effect of Foil Thickness on Quantification of EDS SpectraX-ray energy-dispersive spectrometry (EDS) in the analytical electron microscope (AEM) utilizes thin foil samples. The effect of foil thickness on the quantification of x-ray spectra is discussed.
Document ID
19970014619
Acquisition Source
Johnson Space Center
Document Type
Reprint (Version printed in journal)
Authors
Goldstein, J. I. (Lehigh Univ. Bethlehem, PA United States)
Williams, D. B. (Lehigh Univ. Bethlehem, PA United States)
Date Acquired
August 17, 2013
Publication Date
January 1, 1989
Publication Information
Publication: Microbeam Analysis
Publisher: San Francisco Press, Inc.
Subject Category
Inorganic And Physical Chemistry
Report/Patent Number
NAS 1.26:204011
NASA-CR-204011
Accession Number
97N71214
Funding Number(s)
CONTRACT_GRANT: NAG9-45
Distribution Limits
Public
Copyright
Public Use Permitted.
Document Inquiry

Available Downloads

There are no available downloads for this record.

Related Records

There are no records associated with this record.
No Preview Available