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Current Problems in X-Ray Emission SpectroscopyVarious problems that limit X-ray analysis in the analytical electron microscope are reviewed. Major emphasis is given to the trade-off between minimum mass fraction and spatial resolution. New developments such as high-brightness electron guns, new X-ray spectrometers and clean high-vacuum analysis conditions will lead to major improvements in the accuracy and detectability limits of X-ray emission spectroscopy.
Document ID
19970015517
Acquisition Source
Johnson Space Center
Document Type
Reprint (Version printed in journal)
External Source(s)
doi:10.1016/0304-3991(89)90270-2
Authors
Goldstein, Joseph I. (Lehigh Univ. Bethlehem, PA United States)
Williams, David B. (Lehigh Univ. Bethlehem, PA United States)
Lyman, Charles E. (Lehigh Univ. Bethlehem, PA United States)
Date Acquired
August 17, 2013
Publication Date
January 1, 1989
Publication Information
Publication: Ultramicroscopy
Publisher: Elsevier Science Publishers
Volume: 28
ISSN: 0304-3991
Subject Category
Inorganic And Physical Chemistry
Report/Patent Number
NaS 1.26:204015
NASA-CR-204015
ISSN: 0304-3991
Report Number: NaS 1.26:204015
Report Number: NASA-CR-204015
Accession Number
97N71398
Funding Number(s)
CONTRACT_GRANT: NAG9-45
CONTRACT_GRANT: NSF DMR-84-00427
CONTRACT_GRANT: DE-FG02-86ER-45269
Distribution Limits
Public
Copyright
Public Use Permitted.
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