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Final Design and Integration of Micro-Chip Inductive Edge Sensors for the Seven Segment Demonstrator. Testing of Integrated Edge Sensors in Test PackagesThe contractor attended the critical design review and evaluated the presentations of other team members and presented data on the inductive edge sensor. The prototype micro-chip inductive edge sensor was evaluated, and devices were found to have a number of characteristics which made them unsuitable for installation on the seven segment demonstrator. The amplifier bandwidth was too low, the output drive current was too small, and there is an interaction between the digital circuitry and the amplifier that causes the amplifier to stop functioning. Therefore, the inductive edge sensors were not installed on the seven segment demonstrator. The contractor has participated in instruction, problem analysis, and provided technical assistance to NASA and its contractors for the development of 8 hexagonal mirror faceplates with electronics and edge sensors.
Document ID
19970018375
Acquisition Source
Marshall Space Flight Center
Document Type
Contractor Report (CR)
Authors
Karpinsky, John
(SY Technology, Inc. Huntsville, AL United States)
Date Acquired
September 6, 2013
Publication Date
April 15, 1997
Subject Category
Computer Operations And Hardware
Report/Patent Number
NASA-CR-204345
SYT97-TR-012
NAS 1.26:204345
Report Number: NASA-CR-204345
Report Number: SYT97-TR-012
Report Number: NAS 1.26:204345
Accession Number
97N20354
Funding Number(s)
CONTRACT_GRANT: NASA Order H-27646-D
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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