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Viscosity of Hg(0.84)Zn(0.16)Te Pseudobinary MeltAn oscillating-cup viscometer was developed to measure viscosity of molten HgZnTe ternary semiconductor alloys. Data were collected for the pseudobinary Hg(0.84)Zn(0.16)Te melt between 770 and 850 C. The kinematic viscosity was found to vary from approximately 1.1 to 1.4 x 10(sup -3)sq cm/s. A slow relaxation phenomena was also observed for temperatures from the melting point of 770 to approx. 800 C. Possible mechanisms for this effect are discussed.
Document ID
19970021380
Acquisition Source
Marshall Space Flight Center
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Mazuruk, K.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Su, Ching-Hua
(NASA Marshall Space Flight Center Huntsville, AL United States)
Sha, Yi-Gao
(NASA Marshall Space Flight Center Huntsville, AL United States)
Lehoczky, S. L.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Date Acquired
September 6, 2013
Publication Date
June 15, 1996
Publication Information
Publication: J. Appl. Phys.
Publisher: American Institute of Physics
Volume: 79
Issue: 12
ISSN: 0021-8979
Subject Category
Solid-State Physics
Report/Patent Number
NAS 1.26:204597
NASA-CR-204597
ISSN: 0021-8979
Report Number: NAS 1.26:204597
Report Number: NASA-CR-204597
Accession Number
97N22372
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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