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Micromechanical Oscillating Mass BalanceA micromechanical oscillating mass balance and method adapted for measuring minute quantities of material deposited at a selected location, such as during a vapor deposition process. The invention comprises a vibratory composite beam which includes a dielectric layer sandwiched between two conductive layers. The beam is positioned in a magnetic field. An alternating current passes through one conductive layers, the beam oscillates, inducing an output current in the second conductive layer, which is analyzed to determine the resonant frequency of the beam. As material is deposited on the beam, the mass of the beam increases and the resonant frequency of the beam shifts, and the mass added is determined.
Document ID
19980020838
Acquisition Source
Johnson Space Center
Document Type
Other - Patent
Authors
Altemir, David A.
(NASA Johnson Space Center Houston, TX United States)
Date Acquired
August 17, 2013
Publication Date
November 4, 1997
Subject Category
Instrumentation And Photography
Report/Patent Number
Patent Number: NASA-Case-MSC-22569-1
Patent Number: US-Patent-5,684,276
Patent Application Number: US-Patent-Appl-SN-587762
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-Case-MSC-22569-1|US-Patent-5,684,276
Patent Application
US-Patent-Appl-SN-587762
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