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Rad-Hard/HI-REL FPGAThe goals for a radiation hardened (RAD-HARD) and high reliability (HI-REL) field programmable gate array (FPGA) are described. The first qualified manufacturer list (QML) radiation hardened RH1280 and RH1020 were developed. The total radiation dose and single event effects observed on the antifuse FPGA RH1280 are reported on. Tradeoffs and the limitations in the single event upset hardening are discussed.
Document ID
19980033575
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Jih-Jong Wang (Actel Corporation Sunnyvale, CA United States)
Brian E Cronquist (Actel Corporation)
John E McGowan (Actel Corporation)
Richard B Katz (Goddard Space Flight Center Greenbelt, United States)
Date Acquired
August 18, 2013
Publication Date
July 1, 1997
Publication Information
Publication: Proceedings of the 3rd ESA Electronic Components Conference (EECC '97)
Publisher: European Space Agency
ISBN: 9-29-092263-X
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: ESA Electronic Components Conference (EECC '97)
Location: Noordwijk
Country: NL
Start Date: April 22, 1997
End Date: April 25, 1997
Sponsors: European Space Agency
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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