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Precision Thickness Variation Mapping via One-Transducer Ultrasonic High Resolution Profilometry for Sample with Irregular or Rough SurfaceAn apparatus and method for determination of sample thickness and surface depression utilizing ultrasonic pulses. The sample is held in a predetermined position by a support member having a reference surface. Ultrasonic pulses travel through a medium of known velocity propagation and reflect off the reference surface and a sample surface. Time of flight data of surface echoes are converted to distances between sample surfaces to obtain computer-generated thickness profiles and surface mappings.
Document ID
19980037597
Acquisition Source
Legacy CDMS
Document Type
Other - Patent
Authors
Roth, Don J.
(NASA Lewis Research Center Cleveland, OH United States)
Date Acquired
August 18, 2013
Publication Date
December 23, 1997
Subject Category
Acoustics
Report/Patent Number
Patent Number: US-Patent-5,700,955
Patent Number: NASA-Case-LEW-16228-1
Patent Application Number: US-Patent-Appl-SN-641132
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
US-Patent-5,700,955|NASA-Case-LEW-16228-1
Patent Application
US-Patent-Appl-SN-641132
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