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Eddy Current Method for Fatigue TestingFlux-focusing electromagnetic sensor using a ferromagnetic flux-focusing lens simplifies inspections and increases detectability of fatigue cracks and material loss in high conductivity material. A ferrous shield isolates a high-turn pick-up coil from an excitation coil. Use of the magnetic shield produces a null voltage output across the receiving coil in presence of an unflawed sample. Redistribution of the current flow in the sample caused by the presence of flaws. eliminates the shielding condition and a large output voltage is produced, yielding a clear unambiguous flaw signal. Maximum sensor output is obtained when positioned symmetrically above the crack. By obtaining position of maximum sensor output, it is possible to track the fault and locate the area surrounding its tip. Accuracy of tip location is enhanced by two unique features of the sensor; a very high signal-to-noise ratio of the probe's output resulting in an extremely smooth signal peak across the fault, and a rapidly decaying sensor output outside a small area surrounding the crack tip enabling the search region to be clearly defined. Under low frequency operation, material thinning due to corrosion causes incomplete shielding of the pick-up coil. Low frequency output voltage of the probe is therefore a direct indicator of thickness of the test sample. Fatigue testing a conductive material is accomplished by applying load to the material, applying current to the sensor, scanning the material with the sensor, monitoring the sensor output signal, adjusting material load based on the sensor output signal of the sensor, and adjusting position of the sensor based on its output signal.
Document ID
19980037600
Acquisition Source
Langley Research Center
Document Type
Other - Patent
Authors
Simpson, John W.
(NASA Langley Research Center Hampton, VA United States)
Fulton, James P.
(NASA Langley Research Center Hampton, VA United States)
Wincheski, Russell A.
(NASA Langley Research Center Hampton, VA United States)
Todhunter, Ronald G.
(NASA Langley Research Center Hampton, VA United States)
Namkung, Min
(NASA Langley Research Center Hampton, VA United States)
Nath, Shridhar C.
(NASA Langley Research Center Hampton, VA United States)
Date Acquired
August 18, 2013
Publication Date
December 16, 1997
Subject Category
Quality Assurance And Reliability
Report/Patent Number
Patent Number: NASA-Case-LAR-15046-2
Patent Application Number: US-Patent-Appl-SN-490441
Patent Application Number: US-Patent-Appl-SN-134444
Patent Number: US-Patent-5,698,977
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-Case-LAR-15046-2|US-Patent-5,698,977
Patent Application
US-Patent-Appl-SN-490441|US-Patent-Appl-SN-134444
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