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Technology for Elevated Temperature Tests of Structural PanelsA technique for full-field measurement of surface temperature and in-plane strain using a single grid imaging technique was demonstrated on a sample subjected to thermally-induced strain. The technique is based on digital imaging of a sample marked by an alternating line array of La2O2S:Eu(+3) thermographic phosphor and chromium illuminated by a UV lamp. Digital images of this array in unstrained and strained states were processed using a modified spin filter. Normal strain distribution was determined by combining unstrained and strained grid images using a single grid digital moire technique. Temperature distribution was determined by ratioing images of phosphor intensity at two wavelengths. Combined strain and temperature measurements demonstrated on the thermally heated sample were DELTA-epsilon = +/- 250 microepsilon and DELTA-T = +/- 5 K respectively with a spatial resolution of 0.8 mm.
Document ID
19990078561
Acquisition Source
Langley Research Center
Document Type
Contractor or Grantee Report
Authors
Thornton, E. A.
(Virginia Univ. Charlottesville, VA United States)
Date Acquired
September 6, 2013
Publication Date
July 1, 1999
Subject Category
Structural Mechanics
Report/Patent Number
SEAS-UVA/528515/MAE00/101
Report Number: SEAS-UVA/528515/MAE00/101
Funding Number(s)
CONTRACT_GRANT: NAG1-1678
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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