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Single Axis Piezoceramic GimbalThis paper describes the fabrication, testing, and analysis of a single axis piezoceramic gimbal. The fabrication process consist of pre-stressing a piezoceramic wafer using a high-temperature thermoplastic polyimide and a metal foil. The differential thermal expansion between the ceramic and metal induces a curvature. The pre-stressed, curved piezoceramic is mounted on a support mechanism and a mirror is attached to the piezoceramic. A plot of gimbal angle versus applied voltage to the piezoceramic is presented. A finite element analysis of the piezoceramic gimbal is described. The predicted gimbal angle versus applied voltage is compared to experimental results.
Document ID
19990115890
Acquisition Source
Langley Research Center
Document Type
Technical Memorandum (TM)
Authors
Horner, Garnett C.
(NASA Langley Research Center Hampton, VA United States)
Taleghani, Barmac K.
(Army Research Lab. Hampton, VA United States)
Date Acquired
September 6, 2013
Publication Date
November 1, 1999
Subject Category
Structural Mechanics
Report/Patent Number
L-17833
ARL-TR-2120
NASA/TM-1999-209721
NAS 1.15:209721
Report Number: L-17833
Report Number: ARL-TR-2120
Report Number: NASA/TM-1999-209721
Report Number: NAS 1.15:209721
Funding Number(s)
PROJECT: RTOP 522-32-41-02
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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