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Antifuse FPGA for Space ApplicationsThis paper presents viewgraphs of Antifuse FPGA (Field Programmable Gate Array) for Space Applications. The topics include: 1) A32140DX TID Test; 2) A1280XL Proton Test; 3) SEU (Single Event Upsets) Rate Calculation; 4) Recent Products Test; 5) A1460A TID (Traveling Ionospheric Disturbances) Test; 6) I100 Proton Test; 7) 100/RHI100 SEU Test; 8) I100/RH100 TID Test; 9) A1020S TID Test; 10) TID Charge Pump Failure; 11) Radiation Testing; and SEE (Single Event Effects) Test Setup.
Document ID
20000023219
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Wang, Jih-Jong
(Actel Corp. Sunnyvale, CA United States)
Conquist, Brian
(Actel Corp. Sunnyvale, CA United States)
Sin, Benny
(Actel Corp. Sunnyvale, CA United States)
Moriarta, Jennifer
(Actel Corp. Sunnyvale, CA United States)
Katz, Richard B.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
August 19, 2013
Publication Date
January 1, 1997
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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