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Method and Apparatus for the Portable Identification of Material Thickness and Defects Using Spatially Controlled Heat ApplicationA method and a portable apparatus for the nondestructive identification of defects in structures. The apparatus comprises a heat source and a thermal imager that move at a constant speed past a test surface of a structure. The thermal imager is off set at a predetermined distance from the heat source. The heat source induces a constant surface temperature. The imager follows the heat source and produces a video image of the thermal characteristics of the test surface. Material defects produce deviations from the constant surface temperature that move at the inverse of the constant speed. Thermal noise produces deviations that move at random speed. Computer averaging of the digitized thermal image data with respect to the constant speed minimizes noise and improves the signal of valid defects. The motion of thermographic equipment coupled with the high signal to noise ratio render it suitable for portable, on site analysis.
Document ID
20000030735
Acquisition Source
Langley Research Center
Document Type
Other - Patent
Authors
Cramer, K. Elliott
(NASA Langley Research Center Hampton, VA United States)
Winfree, William P.
(NASA Langley Research Center Hampton, VA United States)
Date Acquired
September 7, 2013
Publication Date
December 14, 1999
Subject Category
Quality Assurance And Reliability
Report/Patent Number
Patent Number: NASA-Case-LAR-15524-1
Patent Application Number: US-Patent-Appl-SN-810058
Patent Number: US-Patent-6,000,844
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-Case-LAR-15524-1|US-Patent-6,000,844
Patent Application
US-Patent-Appl-SN-810058
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