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Method and Apparatus for Evaluating Multilayer Objects for ImperfectionsA multilayer object having multiple layers arranged in a stacking direction is evaluated for imperfections such as voids, delaminations and microcracks. First. an acoustic wave is transmitted into the object in the stacking direction via an appropriate transducer/waveguide combination. The wave propagates through the multilayer object and is received by another transducer/waveguide combination preferably located on the same surface as the transmitting combination. The received acoustic wave is correlated with the presence or absence of imperfections by, e.g., generating pulse echo signals indicative of the received acoustic wave. wherein the successive signals form distinct groups over time. The respective peak amplitudes of each group are sampled and curve fit to an exponential curve. wherein a substantial fit of approximately 80-90% indicates an absence of imperfections and a significant deviation indicates the presence of imperfections. Alternatively, the time interval between distinct groups can be measured. wherein equal intervals indicate the absence of imperfections and unequal intervals indicate the presence of imperfections.
Document ID
20000030738
Acquisition Source
Langley Research Center
Document Type
Other - Patent
Authors
Heyman, Joseph S.
(NASA Langley Research Center Hampton, VA United States)
Abedin, Nurul
(NASA Langley Research Center Hampton, VA United States)
Sun, Kuen J.
(NASA Langley Research Center Hampton, VA United States)
Date Acquired
September 7, 2013
Publication Date
October 19, 1999
Subject Category
Quality Assurance And Reliability
Report/Patent Number
Patent Number: NASA-Case-LAR-14581-3-SB
Patent Application Number: US-Patent-Appl-SN-872492
Patent Application Number: US-Patent-Appl-SN-873407
Patent Number: US-Patent-5,969,253
Patent Application Number: US-Patent-Appl-SN-571687
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Patent
NASA-Case-LAR-14581-3-SB|US-Patent-5,969,253
Patent Application
US-Patent-Appl-SN-872492|US-Patent-Appl-SN-873407|US-Patent-Appl-SN-571687
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