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Observation of Individual Fluorine Atoms from Highly Oriented Poly(Tetrafluoroethylene) Films by Atomic Force MicroscopyDirect observation of the film thickness, molecular structure, and individual fluorine atoms from highly oriented poly(tetrafluoroethylene) (PTFE) films were achieved using atomic force microscopy (AFM). A thin PTFE film is mechanically deposited onto a smooth glass substrate at specific temperatures by a friction-transfer technique. Atomic resolution images of these films show that the chain-like helical structures of the PTFE macromolecules are aligned parallel to each other with an intermolecular spacing of 5.72 A, and individual fluorine atoms are clearly observed along these twisted molecular chains with an interatomic spacing of 2.75 A. Furthermore, the first direct AFM measurements for the radius of the fluorine-helix, and of the carbon-helix in sub-angstrom scale are reported as 1.7 and 0.54 A respectively.
Document ID
20000032164
Acquisition Source
Marshall Space Flight Center
Document Type
Technical Memorandum (TM)
Authors
Lee, J. A.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Date Acquired
September 7, 2013
Publication Date
February 1, 2000
Subject Category
Nonmetallic Materials
Report/Patent Number
M-966
NASA/TM-2000-209962
NAS 1.15:209962
Report Number: M-966
Report Number: NASA/TM-2000-209962
Report Number: NAS 1.15:209962
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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